Electrical Reliability of Flexible Low-Temperature Polycrystalline Oxide Thin-Film Transistors Under Mechanical Stress
| العنوان: | Electrical Reliability of Flexible Low-Temperature Polycrystalline Oxide Thin-Film Transistors Under Mechanical Stress |
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| المؤلفون: | Chanhee Han, Hyojung Kim, Dongbhin Kim, Jaewoo Shin, Yubin Park, Changwoo Byun, Byoungdeog Choi |
| المصدر: | IEEE Transactions on Electron Devices. 70:527-531 |
| بيانات النشر: | Institute of Electrical and Electronics Engineers (IEEE), 2023. |
| سنة النشر: | 2023 |
| مصطلحات موضوعية: | Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials |
| تدمد: | 1557-9646 0018-9383 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::709badf446529a2658c6c79f4d0f00ed https://doi.org/10.1109/ted.2022.3229292 |
| حقوق: | CLOSED |
| رقم الأكسشن: | edsair.doi...........709badf446529a2658c6c79f4d0f00ed |
| قاعدة البيانات: | OpenAIRE |
| تدمد: | 15579646 00189383 |
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