Zinc oxide (ZnO) is a binary material, a semiconductor with a large direct gap (3.3 eV). With their good optoelectronic properties, thin films find several applications such as solar cells, gas sensors, sensors piezoelectric, etc. In this work, thin films of aluminum-doped zinc oxide and lithium-doped zinc oxide are obtained using a simple process called microdroplet. The synthesized samples were characterized by X-ray diffraction (XRD), atomic force microscope (AFM) and UV-visible spectroscopy. X-ray diffraction (XRD) analysis reveals that, thanks to the incorporation of aluminum or lithium, all the thin films prepared are well crystallized in the structure of wurtzite with the preferential orientation (002) in the direction parallel to the C axis. The morphology of the surface of the doped ZnO layers is studied by AFM atomic force microscopy which showed less rough images as well as the surface topography measured between 4 and 10 nm. The optical study by UV-visible spectroscopy revealed a high transparency of the order of 80% and a visible domain emission linked to the doped ZnO compound.
