Vanderbilt has developed a low-cost on-orbit system to assess the radiation reliability and survivability of advanced semiconductor components in space. This system was integrated into the AO-85 CubeSat to enable comparisons between measured data and proton error rate predictions. The Vulcan payload includes the Low-Energy Proton (LEP) Experiment that provides data on the single-event-upset rate of a commercial SRAM. Three additional missions are underway to investigate the upset rate of various technology nodes.
