High temperature Si(0 0 1) surface defect evolution during extended annealing: experimental results and modelling

التفاصيل البيبلوغرافية
العنوان: High temperature Si(0 0 1) surface defect evolution during extended annealing: experimental results and modelling
المؤلفون: J.P. Joly, B. Pichaud, D. Barge
المصدر: Applied Surface Science. 226:341-346
بيانات النشر: Elsevier BV, 2004.
سنة النشر: 2004
مصطلحات موضوعية: Diffusion transport, Silicon, Misorientation, Annealing (metallurgy), Ultra-high vacuum, General Physics and Astronomy, chemistry.chemical_element, Surfaces and Interfaces, General Chemistry, Condensed Matter Physics, Oxygen, Surfaces, Coatings and Films, chemistry, Chemical physics, Oxidizing agent, Physical chemistry
الوصف: Square surface defects evolving in a triangular shape were observed on Si(0 0 1) as the consequence of long annealing step at very high temperature and in slightly oxidizing conditions. The evolution of the size and shape of these defects were studied as a function of time, of surface misorientation and of oxygen/neutral gas ratio. The association of the Burton Cabrera and Frank (BCF) model developed for ultra high vacuum conditions with the Deal and Groves (DG) law for oxidation allows to explain the influence of the studied parameters on the defect evolution. This shows that the oxidation step proceeds with the help of diffusion along the interface rather than with a localized reaction, at least in the conditions of the experiment.
تدمد: 0169-4332
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::86318f8f98278ebe63780f9cccc24b43
https://doi.org/10.1016/j.apsusc.2003.10.036
حقوق: CLOSED
رقم الأكسشن: edsair.doi...........86318f8f98278ebe63780f9cccc24b43
قاعدة البيانات: OpenAIRE