Structure determination of inorganic structures by HREM, Cip, and electron diffraction
| العنوان: | Structure determination of inorganic structures by HREM, Cip, and electron diffraction |
|---|---|
| المؤلفون: | Gunnar Svensson, Xiaodong Zou, Sven Hovmöller, Vladimir G. Zubkov |
| المصدر: | Proceedings, annual meeting, Electron Microscopy Society of America. 51:1204-1205 |
| بيانات النشر: | Cambridge University Press (CUP), 1993. |
| سنة النشر: | 1993 |
| مصطلحات موضوعية: | Crystallography, Materials science, Electron diffraction, General Medicine |
| الوصف: | High resolution electron microscopy (HREM) combined with crystallographic image processing (CIP) is becoming a powerful technique for solving inorganic structures. With the image processing systems CRISP and ELD, running on a personal computer, this technique can be easily established in other laboratories. HREM images and electron diffraction patterns are digitized by a CCD camera and transferred into a PC. Phases and amplitudes are extracted from the Fourier transform of the HREM images. For thin crystals of metal oxides, the phases obtained by HREM and CIP inside the Scherzer resolution of the microscope are identical to the x-ray structure factor phases.Electron diffraction extends to much higher resolution than EM images (beyond 1 Å). The quality of the amplitudes is also higher than that from images, since ED data is not affected by the contract transfer function (CTF). Amplitudes extracted by ELD are close to x-ray diffraction amplitudes (within 30%). |
| تدمد: | 2690-1315 0424-8201 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::90ede047aa1f1e0882af26ee4c30914d https://doi.org/10.1017/s0424820100151854 |
| حقوق: | CLOSED |
| رقم الأكسشن: | edsair.doi...........90ede047aa1f1e0882af26ee4c30914d |
| قاعدة البيانات: | OpenAIRE |
| تدمد: | 26901315 04248201 |
|---|