The influence of surface roughness on the adhesion force
| العنوان: | The influence of surface roughness on the adhesion force |
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| المؤلفون: | T. Schneider, K. Meine, K. Kloß, D. Spaltmann |
| المصدر: | Surface and Interface Analysis. 36:694-697 |
| بيانات النشر: | Wiley, 2004. |
| سنة النشر: | 2004 |
| مصطلحات موضوعية: | Materials science, Cantilever, Silicon, chemistry.chemical_element, Nanotechnology, Surfaces and Interfaces, General Chemistry, Surface finish, Adhesion, Condensed Matter Physics, Surface energy, Surfaces, Coatings and Films, chemistry, Materials Chemistry, Surface roughness, Wafer, Composite material, Contact area |
| الوصف: | Adhesion measurements are presented which were carried out with an atomic force microscope between polymer balls attached to a cantilever and a silicon wafer under ultra high vacuum conditions. In using a silicon surface with a defined structure a correlation between adhesion force and contact area was found. This correlation could partly be explained by the Johnson-Kendall-Roberts model, if a change of the surface energy is assumed as a result of the structuring. For a constant geometric contact area an additional structuring leads to a decrease of the adhesion force. |
| تدمد: | 1096-9918 0142-2421 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::92b7b07b224070c403d2f05979722078 https://doi.org/10.1002/sia.1738 |
| حقوق: | CLOSED |
| رقم الأكسشن: | edsair.doi...........92b7b07b224070c403d2f05979722078 |
| قاعدة البيانات: | OpenAIRE |
| تدمد: | 10969918 01422421 |
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