Automated Continual Learning of Defect Identification in Coherent Diffraction Imaging
| العنوان: | Automated Continual Learning of Defect Identification in Coherent Diffraction Imaging |
|---|---|
| المؤلفون: | Orcun Yildiz, Henry Chan, Krishnan Raghavan, William Judge, Mathew J. Cherukara, Prasanna Balaprakash, Subramanian Sankaranarayanan, Tom Peterka |
| المصدر: | 2022 IEEE/ACM International Workshop on Artificial Intelligence and Machine Learning for Scientific Applications (AI4S). |
| بيانات النشر: | IEEE, 2022. |
| سنة النشر: | 2022 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::9384e3f6fc1bb0f5951b439d410bacf7 https://doi.org/10.1109/ai4s56813.2022.00006 |
| حقوق: | CLOSED |
| رقم الأكسشن: | edsair.doi...........9384e3f6fc1bb0f5951b439d410bacf7 |
| قاعدة البيانات: | OpenAIRE |
| الوصف غير متاح. |