Nonlinear dielectric materials are interesting because their properties can be dynamically reconfigured by an applied field. Even as understanding of their static properties advances rapidly, their dynamics remain much more difficult to predict and control, and experiments are hindered by the difficulty of millimeter-wave electrical characterization. The authors provide a broadband approach to nonlinear dielectric characterization that is widely generalizable, makes few assumptions about the sample, and yields details about the dynamics that are usually inaccessible. Such information about the physics of nonlinear dielectrics will promote millimeter-wave electronics.
