Growth and characterization of epitaxial layers on aluminum nitride substrates prepared from bulk, single crystals

التفاصيل البيبلوغرافية
العنوان: Growth and characterization of epitaxial layers on aluminum nitride substrates prepared from bulk, single crystals
المؤلفون: Daniel D. Koleske, J. W. Yang, J. Carlos Rojo, R. Gaska, M.A. Khan, Michael Shur, Leo J. Schowalter
المصدر: Journal of Crystal Growth. 240:508-512
بيانات النشر: Elsevier BV, 2002.
سنة النشر: 2002
مصطلحات موضوعية: Electron mobility, Materials science, chemistry.chemical_element, Mineralogy, Heterojunction, Nitride, Condensed Matter Physics, Epitaxy, Inorganic Chemistry, chemistry, Chemical engineering, Aluminium, Materials Chemistry, Metalorganic vapour phase epitaxy, Thin film, Fermi gas
الوصف: A comparative study of epitaxy of AlN, GaN and their alloys, grown on c -axis and off-axis substrates of single-crystal aluminum nitride has been carried out. Growth on off-axis (>30°) substrates appears to result in rough surfaces and the absence of two-dimensional electron gas (2DEG). However, smooth morphologies were demonstrated for both homoepitaxial and heteroepitaxial growth on on-axis ( 2 /V s and a sheet density of 8.5×10 12 cm −2 at room temperature, was also demonstrated for the first time.
تدمد: 0022-0248
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a36ab7d0dc442882da9494fc012c7e65
https://doi.org/10.1016/s0022-0248(02)01078-3
حقوق: CLOSED
رقم الأكسشن: edsair.doi...........a36ab7d0dc442882da9494fc012c7e65
قاعدة البيانات: OpenAIRE