A holistic study of edge placement error on fin cut layer in self-aligned double patterning process

التفاصيل البيبلوغرافية
العنوان: A holistic study of edge placement error on fin cut layer in self-aligned double patterning process
المؤلفون: Yuyang Bian, Biqiu Liu, Xijun Guan, Xiaobo Guo, Cong Zhang, Wenzhan Zhou, Jun Huang, Yu Zhang, Jiawang Song, Yang Gao, Shmuel Nissim, Kevin Houchens, Omri Baum, Qiang Zhou, Zaisan Yang, Amit Zakay, Tal Ayzik, Yaniv Abramovitz
المصدر: Metrology, Inspection, and Process Control XXXVI.
بيانات النشر: SPIE, 2022.
سنة النشر: 2022
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a5cda6b86bb61fe7eb7eee181d776b72
https://doi.org/10.1117/12.2614221
رقم الأكسشن: edsair.doi...........a5cda6b86bb61fe7eb7eee181d776b72
قاعدة البيانات: OpenAIRE