MEMS-Based Nanomechanics: Influence of MEMS Design on Test Temperature

التفاصيل البيبلوغرافية
العنوان: MEMS-Based Nanomechanics: Influence of MEMS Design on Test Temperature
المؤلفون: E. K. Baumert, Samuel Graham, B. Pant, B. L. Allen, Olivier N. Pierron, Ken Gall, Sukwon Choi
المصدر: Experimental Mechanics. 52:607-617
بيانات النشر: Springer Science and Business Media LLC, 2011.
سنة النشر: 2011
مصطلحات موضوعية: Microelectromechanical systems, Materials science, business.industry, Mechanical Engineering, Aerospace Engineering, Nanotechnology, Temperature measurement, Finite element method, Displacement (vector), Mechanics of Materials, Solid mechanics, Optoelectronics, business, Actuator, Nanomechanics, Tensile testing
الوصف: Microelectromechanical system (MEMS) devices based on electro-thermal actuation have been used over the past few years to perform tensile tests on nanomaterials. However, previous MEMS designs only allowed small (e.g.
تدمد: 1741-2765
0014-4851
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::aa5e2855838f3ab2a3e458dfc119f024
https://doi.org/10.1007/s11340-011-9526-8
حقوق: CLOSED
رقم الأكسشن: edsair.doi...........aa5e2855838f3ab2a3e458dfc119f024
قاعدة البيانات: OpenAIRE