Identification of polar and nonpolar faces in ZnO nanostructures using conductive atomic force microscopy

التفاصيل البيبلوغرافية
العنوان: Identification of polar and nonpolar faces in ZnO nanostructures using conductive atomic force microscopy
المؤلفون: G. Mangamma, Prasana Sahoo, Sitaram Dash, A. Rajesh, Mohammed Kamruddin
المصدر: Ferroelectrics. 519:157-163
بيانات النشر: Informa UK Limited, 2017.
سنة النشر: 2017
مصطلحات موضوعية: 010302 applied physics, Spin coating, Nanostructure, Materials science, business.industry, Schottky barrier, 02 engineering and technology, Conductive atomic force microscopy, Conductivity, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Electronic, Optical and Magnetic Materials, Characterization (materials science), 0103 physical sciences, Optoelectronics, Nanorod, 0210 nano-technology, business, Nanoscopic scale
الوصف: Here we present the local electrical characterization of individual ZnO nanorods (NRs) synthesized by spin coating method using precursor sol. Conductive atomic force microscopy (CAFM) was employed for investigating the local conductivity of these ZnO NRs. I-V curves studies on hexagonal top planes and rectangular side planes have shown nano-Schottky contact between ZnO NRs and tip. The Schottky barrier heights (SBHs) have been calculated to ∼0.63 eV, and ∼0.55 eV for these planes which are attributed to the polar and nonpolar faces respectively. This work provides a path way for constructing highly integrated nanoscale electronic devices with precise control.
تدمد: 1563-5112
0015-0193
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b3570c8f1431360d8fc64f62b4be7d31
https://doi.org/10.1080/00150193.2017.1361239
رقم الأكسشن: edsair.doi...........b3570c8f1431360d8fc64f62b4be7d31
قاعدة البيانات: OpenAIRE