Identification of polar and nonpolar faces in ZnO nanostructures using conductive atomic force microscopy
العنوان: | Identification of polar and nonpolar faces in ZnO nanostructures using conductive atomic force microscopy |
---|---|
المؤلفون: | G. Mangamma, Prasana Sahoo, Sitaram Dash, A. Rajesh, Mohammed Kamruddin |
المصدر: | Ferroelectrics. 519:157-163 |
بيانات النشر: | Informa UK Limited, 2017. |
سنة النشر: | 2017 |
مصطلحات موضوعية: | 010302 applied physics, Spin coating, Nanostructure, Materials science, business.industry, Schottky barrier, 02 engineering and technology, Conductive atomic force microscopy, Conductivity, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Electronic, Optical and Magnetic Materials, Characterization (materials science), 0103 physical sciences, Optoelectronics, Nanorod, 0210 nano-technology, business, Nanoscopic scale |
الوصف: | Here we present the local electrical characterization of individual ZnO nanorods (NRs) synthesized by spin coating method using precursor sol. Conductive atomic force microscopy (CAFM) was employed for investigating the local conductivity of these ZnO NRs. I-V curves studies on hexagonal top planes and rectangular side planes have shown nano-Schottky contact between ZnO NRs and tip. The Schottky barrier heights (SBHs) have been calculated to ∼0.63 eV, and ∼0.55 eV for these planes which are attributed to the polar and nonpolar faces respectively. This work provides a path way for constructing highly integrated nanoscale electronic devices with precise control. |
تدمد: | 1563-5112 0015-0193 |
URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::b3570c8f1431360d8fc64f62b4be7d31 https://doi.org/10.1080/00150193.2017.1361239 |
رقم الأكسشن: | edsair.doi...........b3570c8f1431360d8fc64f62b4be7d31 |
قاعدة البيانات: | OpenAIRE |
تدمد: | 15635112 00150193 |
---|