Effect of Cu-Assisted Chemical Etching for Black Silicon

التفاصيل البيبلوغرافية
العنوان: Effect of Cu-Assisted Chemical Etching for Black Silicon
المؤلفون: Young Ho Cho, Jeong Eun Park, Donggun Lim, Sangmuk Kang, Hye Kwon Hong, Dong Sik Kim
المصدر: 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC).
بيانات النشر: IEEE, 2018.
سنة النشر: 2018
مصطلحات موضوعية: 010302 applied physics, Fabrication, Materials science, Silicon, Black silicon, Analytical chemistry, chemistry.chemical_element, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Reflectivity, Isotropic etching, chemistry.chemical_compound, chemistry, Etching (microfabrication), 0103 physical sciences, Surface modification, Wafer, 0210 nano-technology
الوصف: Black silicon is surface modification of silicon like nano-structure, that significantly decreases reflectivity of the silicon wafer surfaces. An effective and economical fabrication process for black silicon is metal-assisted chemical etching (MACE) method. In this paper, Cu particles were deposited using solution of $\mathbf{Cu(NO_{3})_{2}:HF=0.1M:1.8M}$ and wafers were etched by $\mathbf{HF/H_{2}O_{2}}$ solution. The reflectance of 5.92% was obtained with etching time of 90 min. This is because the wafer was non-uniformly etched with the increasing of etching time. With the etching time of 5 min, it showed the lowest reflectance of 3.96% because of uniform structure and reduced pore size.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b4ad52f9b4400f6de92d3c8b8ed978eb
https://doi.org/10.1109/pvsc.2018.8547405
رقم الأكسشن: edsair.doi...........b4ad52f9b4400f6de92d3c8b8ed978eb
قاعدة البيانات: OpenAIRE