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Structural investigation of nanoporous alumina film with grazing incidence small angle X-ray scattering

التفاصيل البيبلوغرافية
العنوان: Structural investigation of nanoporous alumina film with grazing incidence small angle X-ray scattering
المؤلفون: Denis Buttard, R. Lazzari, Tobias U. Schülli
المصدر: physica status solidi (a). 210:2521-2525
بيانات النشر: Wiley, 2013.
سنة النشر: 2013
مصطلحات موضوعية: 010302 applied physics, Materials science, Anodizing, Nanoporous, Small-angle X-ray scattering, Scattering, Ultra-high vacuum, 02 engineering and technology, Surfaces and Interfaces, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Synchrotron, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Crystallography, law, 0103 physical sciences, Materials Chemistry, Grazing-incidence small-angle scattering, Wafer, Electrical and Electronic Engineering, Composite material, 0210 nano-technology
الوصف: Nanoporous alumina films (NPAF) have been elaborated by anodization of an aluminum film on silicon wafer. Ex situ structural characterization of the films has been achieved with grazing incidence small angle X-ray scattering under ultra high vacuum atmosphere and using a synchrotron source. The comparison of the experimental patterns with suitable modeling confirms the cylindrical geometry of the pores well as the good local hexagonal order. (C) 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
تدمد: 1862-6300
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b8c39544c75cbce64d0e4d0c6f22cc95
https://doi.org/10.1002/pssa.201330024
حقوق: CLOSED
رقم الأكسشن: edsair.doi...........b8c39544c75cbce64d0e4d0c6f22cc95
قاعدة البيانات: OpenAIRE
الوصف
تدمد:18626300