Investigation of SrRuO3barriers in SNS junctions
| العنوان: | Investigation of SrRuO3barriers in SNS junctions |
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| المؤلفون: | C L Jia, G Ockenfuss, Alex I. Braginski, C Copetti, R Domel |
| المصدر: | Superconductor Science and Technology. 7:277-280 |
| بيانات النشر: | IOP Publishing, 1994. |
| سنة النشر: | 1994 |
| مصطلحات موضوعية: | In situ, Materials science, Condensed matter physics, Orders of magnitude (temperature), Metals and Alloys, Condensed Matter Physics, Normal resistance, Sputtering, Transmission electron microscopy, Materials Chemistry, Ceramics and Composites, Cathode sputtering, Electrical and Electronic Engineering, Thin film |
| الوصف: | High-quality films and multilayers of SrRuO3 and YBa2Cu3O7 (YBCO) have been grown by off-axis sputtering. High-resolution transmission electron microscopy proved that the interface is atomically sharp. SNS junctions with SrRuO3 barriers have been fabricated ex situ in an edge geometry, and in a sandwich geometry with both interfaces grown in situ. Supercurrents have been observed with barrier thicknesses from 10 to 40 nm, and Shapiro steps could be detected. In both junction geometries the normal resistance is several orders of magnitude higher, as would be expected from the resistance of the SrRuO3 film, and shows a nonmetallic temperature dependence. An exponential dependence of the normal resistance upon the barrier thickness has been observed. |
| تدمد: | 1361-6668 0953-2048 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::c2a3b1f9b217cea02447a24dc85a1fc7 https://doi.org/10.1088/0953-2048/7/5/012 |
| حقوق: | OPEN |
| رقم الأكسشن: | edsair.doi...........c2a3b1f9b217cea02447a24dc85a1fc7 |
| قاعدة البيانات: | OpenAIRE |
| تدمد: | 13616668 09532048 |
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