Resistive Switching Characteristics of HfO x -Based Memristor by Inserting GeTe Layer
العنوان: | Resistive Switching Characteristics of HfO x -Based Memristor by Inserting GeTe Layer |
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المؤلفون: | Hua-Nan Liang, Na Bai, Lan-Qing Zou, Hua-Jun Sun, Kan-Hao Xue, Wei-Ming Cheng, Hong Lu, Xiang-Shui Miao |
المصدر: | IEEE Transactions on Electron Devices. 70:83-87 |
بيانات النشر: | Institute of Electrical and Electronics Engineers (IEEE), 2023. |
سنة النشر: | 2023 |
مصطلحات موضوعية: | Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials |
تدمد: | 1557-9646 0018-9383 |
URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::cd34f5efb5e1bd2e53a4cf2d167c753d https://doi.org/10.1109/ted.2022.3225123 |
حقوق: | CLOSED |
رقم الأكسشن: | edsair.doi...........cd34f5efb5e1bd2e53a4cf2d167c753d |
قاعدة البيانات: | OpenAIRE |
تدمد: | 15579646 00189383 |
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