Resistive Switching Characteristics of HfO x -Based Memristor by Inserting GeTe Layer

التفاصيل البيبلوغرافية
العنوان: Resistive Switching Characteristics of HfO x -Based Memristor by Inserting GeTe Layer
المؤلفون: Hua-Nan Liang, Na Bai, Lan-Qing Zou, Hua-Jun Sun, Kan-Hao Xue, Wei-Ming Cheng, Hong Lu, Xiang-Shui Miao
المصدر: IEEE Transactions on Electron Devices. 70:83-87
بيانات النشر: Institute of Electrical and Electronics Engineers (IEEE), 2023.
سنة النشر: 2023
مصطلحات موضوعية: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials
تدمد: 1557-9646
0018-9383
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cd34f5efb5e1bd2e53a4cf2d167c753d
https://doi.org/10.1109/ted.2022.3225123
حقوق: CLOSED
رقم الأكسشن: edsair.doi...........cd34f5efb5e1bd2e53a4cf2d167c753d
قاعدة البيانات: OpenAIRE