التفاصيل البيبلوغرافية
| العنوان: |
Systematic methods to identify and verify non-visible defects in silicon substrate |
| المؤلفون: |
Hongwei Huang, Candy Liu, Clieve Dai, Pinglung Liao, Wei Xu, Winnie Wei, Luke Wu, J. J. Xin |
| المصدر: |
Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). |
| بيانات النشر: |
IEEE, 2014. |
| سنة النشر: |
2014 |
| مصطلحات موضوعية: |
Materials science, Silicon, chemistry, business.industry, Electronic engineering, chemistry.chemical_element, Optoelectronics, Substrate (printing), business |
| URL الوصول: |
https://explore.openaire.eu/search/publication?articleId=doi_________::d67f0b98c39a2e02efa2be102d6be7a3
https://doi.org/10.1109/ipfa.2014.6898133 |
| رقم الأكسشن: |
edsair.doi...........d67f0b98c39a2e02efa2be102d6be7a3 |
| قاعدة البيانات: |
OpenAIRE |
