Controlled modifications of electron injection on Au/Si and Au/SiO2/Si contacts using ballistic electron emission microscopy
| العنوان: | Controlled modifications of electron injection on Au/Si and Au/SiO2/Si contacts using ballistic electron emission microscopy |
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| المؤلفون: | I. Zorkani, Adil Chahboun, Roland Coratger, A. Pascale, F. Ajustron, J. Beauvillain, P. Baules |
| المصدر: | Journal of Applied Physics. 89:6302-6307 |
| بيانات النشر: | AIP Publishing, 2001. |
| سنة النشر: | 2001 |
| مصطلحات موضوعية: | Materials science, Silicon, chemistry, Transition metal, Electron injection, Microscopy, General Physics and Astronomy, chemistry.chemical_element, Gold surface, Atomic physics, Reflectivity, Semimetal, Ballistic electron emission microscopy |
| الوصف: | In this article, ballistic electron emission microscopy (BEEM) induced modifications on Au/Si and Au/SiO2/Si contacts are presented. BEEM current can be locally enhanced or reduced in a controlled manner. These observations are attributed to tip induced modifications on the gold surface. According to Au thickness, x-ray reflectivity experiments show different surface evolutions correlated to the size variations of the modifications introduced as a function of time. |
| تدمد: | 1089-7550 0021-8979 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::d764c800f05d545c2f5ad712fc1cf674 https://doi.org/10.1063/1.1365432 |
| رقم الأكسشن: | edsair.doi...........d764c800f05d545c2f5ad712fc1cf674 |
| قاعدة البيانات: | OpenAIRE |
Find this article in full text from Scitation. | تدمد: | 10897550 00218979 |
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