A model based on the Darken theory was used to describe interdiffusion in PbSe/PbTe heterostructures. Chalcogen diffusion coefficients were calculated from the selenium and tellurium concentration depth profiles recorded by sputtered-neutrals mass spectrometry technique. The temperature dependences of the chalcogen diffusion coefficients were obtained in the temperature range 620–750 K. The influence of the surface damaged layer is considered to be responsible for the observed deflection from the Darken model of diffusion.
