A Dual Mode Redundant Approach for Microprocessor Soft Error Hardness

التفاصيل البيبلوغرافية
العنوان: A Dual Mode Redundant Approach for Microprocessor Soft Error Hardness
المؤلفون: Nathan D. Hindman, Dan W. Patterson, Satendra Kumar Maurya, Lawrence T. Clark, Keith E. Holbert, S. M. Guertin
المصدر: IEEE Transactions on Nuclear Science. 58:3018-3025
بيانات النشر: Institute of Electrical and Electronics Engineers (IEEE), 2011.
سنة النشر: 2011
مصطلحات موضوعية: Nuclear and High Energy Physics, Sequential logic, Computer science, Pipeline (computing), Register file, Hardware_PERFORMANCEANDRELIABILITY, Microarchitecture, law.invention, Microprocessor, Soft error, Nuclear Energy and Engineering, CMOS, law, Electronic engineering, Electrical and Electronic Engineering, Error detection and correction
الوصف: A dual mode redundant (DMR) logic data path with instruction restart that detects errors at register file (RF) write-back is presented. The DMR RF allows SEU correction using parity to detect RF entry nibbles that are correct in one copy but not the other. Detection and backing out incorrect write data are also described. The radiation hardened by design (RHBD) circuits are implemented in 90 nm CMOS. The DMR microarchitecture is described, including pipelining, error handling, and the associated hardware. Heavy ion and proton testing validate the approach. Experimentally measured cross sections and examples of errors due to pipeline SET or RF SEU are shown. Critical node spacing and the mitigation of multiple node collection are also described.
تدمد: 0018-9499
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e24de2e0a05161ad85f959ceffd7d724
https://doi.org/10.1109/tns.2011.2168828
حقوق: CLOSED
رقم الأكسشن: edsair.doi...........e24de2e0a05161ad85f959ceffd7d724
قاعدة البيانات: OpenAIRE