In Situ Doped Source/Drain for Performance Enhancement of Double-Gated Poly-Si Nanowire Transistors

التفاصيل البيبلوغرافية
العنوان: In Situ Doped Source/Drain for Performance Enhancement of Double-Gated Poly-Si Nanowire Transistors
المؤلفون: Yu-Chia Chang, Tiao-Yuan Huang, Horng-Chih Lin, Chuan-Ding Lin, Wei-Chen Chen
المصدر: IEEE Transactions on Electron Devices. 57:1608-1615
بيانات النشر: Institute of Electrical and Electronics Engineers (IEEE), 2010.
سنة النشر: 2010
مصطلحات موضوعية: Materials science, Plasma etching, Equivalent series resistance, business.industry, Transistor, Nanowire, Nanotechnology, Electronic, Optical and Magnetic Materials, law.invention, Thin-film transistor, law, Microelectronics, Optoelectronics, Field-effect transistor, Electrical and Electronic Engineering, business, Leakage (electronics)
الوصف: A poly-Si nanowire (NW) thin-film transistor configured with the double-gated scheme was fabricated and characterized. The fabrication process features the clever use of selective plasma etching to form a rectangular NW underneath a hard mask. In this paper, we show that replacing the original ion-implanted poly-Si with in situ doped poly-Si for the source/drain significantly enhances the device performance, including steeper subthreshold swing (SS), larger on/off current ratio, and reduced series resistance. In particular, the SS is improved to a record-breaking low value of 73 mV/dec, which, to the best of our knowledge, is the most ideal ever reported for a poly-Si based device. The new NW transistors with such excellent switching properties are highly promising for reducing power consumption and operational voltage in practical circuit applications.
تدمد: 1557-9646
0018-9383
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e2d61d7972f7288c14fe4e3b9a01b86e
https://doi.org/10.1109/ted.2010.2049227
حقوق: CLOSED
رقم الأكسشن: edsair.doi...........e2d61d7972f7288c14fe4e3b9a01b86e
قاعدة البيانات: OpenAIRE