Physical mechanism responsible for degradation of organic light-emitting diodes

التفاصيل البيبلوغرافية
العنوان: Physical mechanism responsible for degradation of organic light-emitting diodes
المؤلفون: JaeMan Kim, Youbong Lim, DooSup Hwang, HoonHee Kim, JungAe Choi, Youngjin Lee, Dongjune Kim, DongHee Yoon, Soohoa Jeong
المصدر: Microelectronic Engineering. 129:21-23
بيانات النشر: Elsevier BV, 2014.
سنة النشر: 2014
مصطلحات موضوعية: Arrhenius equation, Materials science, business.industry, Astrophysics::High Energy Astrophysical Phenomena, Astrophysics::Cosmology and Extragalactic Astrophysics, Condensed Matter Physics, Luminance, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, symbols.namesake, OLED, symbols, Optoelectronics, Degradation (geology), Electrical and Electronic Engineering, Exponential decay, business, Formation rate, Astrophysics::Galaxy Astrophysics, Diode
الوصف: Degradation of organic light-emitting diodes (OLEDs) is primarily due to the formation of the non-emissive centers, and their formation rate is dependent on the temperature. We observed the linear dependence of total luminance on the temperature, and formulated a novel degradation model to present an analytic function for the OLED degradation with physically meaningful fitting parameters. It was found that the stretched exponential decay (SED) behavior of the degradation is mainly due to the temperature dependence of the luminance.
تدمد: 0167-9317
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e4752d698d01254ac46df6c4aa522635
https://doi.org/10.1016/j.mee.2014.06.020
حقوق: CLOSED
رقم الأكسشن: edsair.doi...........e4752d698d01254ac46df6c4aa522635
قاعدة البيانات: OpenAIRE