Evaluation of Discontinuities in Microstrip Transmission Lines by Picosecond Time Domain Reflectometry Technique
| العنوان: | Evaluation of Discontinuities in Microstrip Transmission Lines by Picosecond Time Domain Reflectometry Technique |
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| المؤلفون: | N M More, V P Pawar, B R Sharma, S C Mehrotra |
| المصدر: | IETE Technical Review. 19:119-124 |
| بيانات النشر: | Informa UK Limited, 2002. |
| سنة النشر: | 2002 |
| مصطلحات موضوعية: | Materials science, business.industry, Electrical engineering, Classification of discontinuities, Capacitance, Characteristic impedance, Inductance, Printed circuit board, Optics, Reflection (physics), Time domain, Electrical and Electronic Engineering, Reflectometry, business |
| الوصف: | The narrow and wide trace discontinuities in microstrip transmission lines are designed and fabricated on glass-epoxy board by standard printing circuit board (PCB) technology. These discontinuities are characterized by evaluating their characteristic Impedance (Z 0 ), excess inductance (AL), excess capacitance (ΔC), and peak percent reflection (ρ m a x ), by single ended time domain reflectometry (TDR) technique at room temperature. It is observed that narrow trace discontinuities lead to Increase In values of characteristic Impedance and Inductance while wide trace discontinuities lead to decrease in characteristic Impedance and capacitance. The experimental values of various parameters like characteristic Impedance, Z 0 , excess Inductance, AL, excess capacitance, AC, and maximum peak reflection, ρ m a x , are found to be in good agreement with their corresponding theoretical values. |
| تدمد: | 0974-5971 0256-4602 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::f209f510b9cf0391c3bc610974314aad https://doi.org/10.1080/02564602.2002.11417020 |
| رقم الأكسشن: | edsair.doi...........f209f510b9cf0391c3bc610974314aad |
| قاعدة البيانات: | OpenAIRE |
PDF full text from Publisher | تدمد: | 09745971 02564602 |
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