17 μm microbolometer FPA technology at BAE Systems

التفاصيل البيبلوغرافية
العنوان: 17 μm microbolometer FPA technology at BAE Systems
المؤلفون: Sherman Chan, Sandra Hyland, Thomas Dumas, Tuyet Bach, Scott D. Carpenter, Jonathan N. Ishii, Richard J. Blackwell, Balwinder Sujlana, Lacroix Daniel P
المصدر: SPIE Proceedings.
بيانات النشر: SPIE, 2009.
سنة النشر: 2009
مصطلحات موضوعية: Materials science, Pixel, business.industry, Resolution (electron density), Time constant, Optoelectronics, Microbolometer, business
الوصف: BAE Systems has continued to advance its 17 μm pitch LWIR 640 x 480 microbolometer technology with improvements in pixel performance and initial production for several emerging products. In addition, we have developed short time constant variants of our standard pixel design to support applications requiring short thermal time constants. The technology is expanding to include a 1024x768 format megapixel FPA to support higher resolution applications.
تدمد: 0277-786X
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f341ee5a93c249814951e44ea6c1a913
https://doi.org/10.1117/12.819389
رقم الأكسشن: edsair.doi...........f341ee5a93c249814951e44ea6c1a913
قاعدة البيانات: OpenAIRE