Photonic-Crystal-Fiber Quantum Probes for High-Resolution Thermal Imaging
العنوان: | Photonic-Crystal-Fiber Quantum Probes for High-Resolution Thermal Imaging |
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المؤلفون: | Sean M. Blakley, Ilya V. Fedotov, Viatcheslav N. Agafonov, Dawson T. Nodurft, Xinghua Liu, Xiaohan Liu, Christapher Vincent, Aleksei M. Zheltikov, Valery A. Davydov, Kyle Sower, Jiru Liu, Alexey V. Akimov |
المساهمون: | Institute of Tibetan Plateau Research (ITPR), Chinese Academy of Sciences [Changchun Branch] (CAS), GREMAN (matériaux, microélectronique, acoustique et nanotechnologies) (GREMAN - UMR 7347), Institut National des Sciences Appliquées - Centre Val de Loire (INSA CVL), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Université de Tours (UT)-Centre National de la Recherche Scientifique (CNRS), Russian Academy of Sciences [Moscow] (RAS), Université de Tours-Institut National des Sciences Appliquées - Centre Val de Loire (INSA CVL), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS) |
المصدر: | Physical Review Applied Physical Review Applied, American Physical Society, 2020, 13 (4), pp.044048. ⟨10.1103/PhysRevApplied.13.044048⟩ |
بيانات النشر: | HAL CCSD, 2020. |
سنة النشر: | 2020 |
مصطلحات موضوعية: | [PHYS]Physics [physics], Materials science, Resolution (electron density), General Physics and Astronomy, Diamond, 02 engineering and technology, engineering.material, 021001 nanoscience & nanotechnology, 01 natural sciences, Fluorescence, Molecular physics, Imaging phantom, Nanocrystals, Interference (communication), 0103 physical sciences, Thermal, engineering, Fiber, 010306 general physics, 0210 nano-technology, Photonic-crystal fiber |
الوصف: | All-optical thermometry presents a promising avenue of investigation for sensitive biological and electronic systems, with methods free of radio-frequency interference of particular importance. In this work, an all-optical scanning fiber thermometer is tested and shown to possess $5\phantom{\rule{0.2em}{0ex}}\ensuremath{\mu}\mathrm{m}$ spatial and $20\phantom{\rule{0.2em}{0ex}}\mathrm{mK}/\sqrt{\mathrm{Hz}}$ temperature resolution. This probe is then used to generate noncontact scanning thermal images of active circuit elements with microscale thermal features. |
اللغة: | English |
تدمد: | 2331-7019 |
URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0c8bb6da699f11c084f1ccd868ba7322 https://hal-univ-tours.archives-ouvertes.fr/hal-02548381 |
حقوق: | CLOSED |
رقم الأكسشن: | edsair.doi.dedup.....0c8bb6da699f11c084f1ccd868ba7322 |
قاعدة البيانات: | OpenAIRE |
تدمد: | 23317019 |
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