Grain Boundaries in Cu(In, Ga)Se 2 : A Review On Composition–Electronic Property Relationships by Atom Probe Tomography and Correlative Microscopy
| العنوان: | Grain Boundaries in Cu(In, Ga)Se 2 : A Review On Composition–Electronic Property Relationships by Atom Probe Tomography and Correlative Microscopy |
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| المؤلفون: | Sascha Sadewasser, Mohit Raghuwanshi, Roland Wuerz, Oana-Eugenia Cojocaru-Miredin |
| المصدر: | Advanced Functional Materials Advanced functional materials 31(41), 2103119 (2021). doi:10.1002/adfm.202103119 |
| سنة النشر: | 2021 |
| مصطلحات موضوعية: | 010302 applied physics, Elemental composition, Materials science, Correlative microscopy, Analytical chemistry, 02 engineering and technology, Atom probe, Composition (combinatorics), 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Electronic, Optical and Magnetic Materials, law.invention, Biomaterials, Scanning probe microscopy, law, 0103 physical sciences, Electrochemistry, Grain boundary, ddc:530, 0210 nano-technology |
| الوصف: | Advanced functional materials 31(41), 2103119 (2021). doi:10.1002/adfm.202103119 Published by Wiley-VCH, Weinheim |
| تدمد: | 1616-301X |
| DOI: | 10.1002/adfm.202103119 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_dedup___::547a52578fbbe8383b96ad2cf72d7a46 |
| حقوق: | OPEN |
| رقم الأكسشن: | edsair.doi.dedup.....547a52578fbbe8383b96ad2cf72d7a46 |
| قاعدة البيانات: | OpenAIRE |
| تدمد: | 1616301X |
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| DOI: | 10.1002/adfm.202103119 |