Imaging performance of a CaWO4/CMOS sensor
| العنوان: | Imaging performance of a CaWO4/CMOS sensor |
|---|---|
| المؤلفون: | Lida Gogou, Athanasios Bakas, Christos Michail, Georgia Oikonomou, I. Valais, V. Koukou, Eleftherios Lavdas, N. Martini, George Panayiotakis, George Fountos, Konstantinos Ninos, Ioannis Kandarakis |
| المصدر: | Frattura ed Integrità Strutturale; Vol. 13 No. 50 (2019): October 2019; 471-480 Frattura ed Integrità Strutturale; V. 13 N. 50 (2019): October 2019; 471-480 Frattura ed Integrità Strutturale, Vol 13, Iss 50, Pp 471-480 (2019) Frattura ed Integrità Strutturale, Vol 13, Iss 50 (2019) |
| بيانات النشر: | Gruppo Italiano Frattura (IGF), 2019. |
| سنة النشر: | 2019 |
| مصطلحات موضوعية: | CMOS sensor, Materials science, Pixel, business.industry, Mechanical Engineering, lcsh:Mechanical engineering and machinery, lcsh:TA630-695, lcsh:Structural engineering (General), Transfer function, Phosphors, MTF, CMOS, Mechanics of Materials, CMOS sensors, Optical transfer function, Nondestructive testing, Optoelectronics, lcsh:TJ1-1570, Spatial frequency, Medical imaging, business, Image resolution, CaWO4, APS |
| الوصف: | The aim of this study was to investigate the modulation transfer function (MTF) and the effective gain transfer function (eGTF) of a non-destructive testing (NDT)/industrial inspection complementary metal oxide semiconductor (CMOS) sensor in conjunction with a thin calcium tungstate (CaWO4) screen. Thin screen samples, with dimensions of 2.7x3.6 cm2 and thickness of 118.9 μm, estimated from scanning electron microscopy-SEM images, were extracted from an Agfa Curix universal screen and coupled to the active area of an active pixel (APS) CMOS sensor. MTF was assessed using the slanted-edge method, following the IEC 62220-1-1:2015 method. MTF values were found high across the examined spatial frequency range. eGTF was found maximum when CaWO4 was combined with charge-coupled devices (CCD) of broadband anti-reflection (AR) coating (17.52 at 0 cycles/mm). The combination of the thin CaWO4 screen with the CMOS sensor provided very promising image resolution and adequate efficiency properties, thus could be also considered for use in CMOS based X-ray imaging devices, for various applications. |
| وصف الملف: | application/pdf |
| اللغة: | English |
| تدمد: | 1971-8993 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5685d6666b12deff40c4b252dfc664d8 https://www.fracturae.com/index.php/fis/article/view/2614 |
| حقوق: | OPEN |
| رقم الأكسشن: | edsair.doi.dedup.....5685d6666b12deff40c4b252dfc664d8 |
| قاعدة البيانات: | OpenAIRE |
| تدمد: | 19718993 |
|---|