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Ballistic electron emission microscopy of Au/n-ZnSe contacts and local density of states spectroscopy

التفاصيل البيبلوغرافية
العنوان: Ballistic electron emission microscopy of Au/n-ZnSe contacts and local density of states spectroscopy
المؤلفون: Anura Priyajith Samantilleke, J. Beauvillain, Adil Chahboun, F. Ajustron, Roland Coratger, I. M. Dharmadasa
المصدر: Scopus-Elsevier
CIÊNCIAVITAE
بيانات النشر: AIP Publishing, 2000.
سنة النشر: 2000
مصطلحات موضوعية: Impact ionization, Local density of states, Semiconductor, Chemistry, business.industry, General Physics and Astronomy, High voltage, Atomic physics, Spectroscopy, business, Spectral line, Ballistic electron emission microscopy, Voltage
الوصف: Ballistic electron emission microscopy (BEEM) has been used to investigate the Au/n-ZnSe contact at high voltage. A statistical barrier height value of 1.63 +/- 0.05 eV is obtained. The metal-insulator-semiconductor structure is invoked to explain domains of low electron transmission. Features appear in BEEM spectra at higher voltages and can be attributed to the density of empty states in the semiconductor. Impact ionization effects are observed when the electron kinetic energy exceeds the band-gap energy. (C) 2000 American Institute of Physics. [S0021-8979(00)02104-6].
تدمد: 1089-7550
0021-8979
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6512d2a89aac398e1831dd6e8b18bb3e
https://doi.org/10.1063/1.372195
رقم الأكسشن: edsair.doi.dedup.....6512d2a89aac398e1831dd6e8b18bb3e
قاعدة البيانات: OpenAIRE
الوصف
تدمد:10897550
00218979