FORTE – a multipurpose high-vacuum diffractometer for tender X-ray diffraction and spectroscopy at the SIRIUS beamline of Synchrotron SOLEIL
| العنوان: | FORTE – a multipurpose high-vacuum diffractometer for tender X-ray diffraction and spectroscopy at the SIRIUS beamline of Synchrotron SOLEIL |
|---|---|
| المؤلفون: | Philippe Fontaine, A. Fouchet, J.-M. Dubuisson, J.-M. Kiat, Niels Keller, Christer Engblom, Y. M. Abiven, Gianluca Ciatto, Bruno Berini, Yves Dumont, M. Lecroard, N. Aubert, P.-E. Janolin |
| المساهمون: | Synchrotron SOLEIL (SSOLEIL), Centre National de la Recherche Scientifique (CNRS), Laboratoire Structures, Propriétés et Modélisation des solides (SPMS), Institut de Chimie du CNRS (INC)-CentraleSupélec-Centre National de la Recherche Scientifique (CNRS), Groupe d'Etude de la Matière Condensée (GEMAC), Université de Versailles Saint-Quentin-en-Yvelines (UVSQ)-Centre National de la Recherche Scientifique (CNRS) |
| المصدر: | Journal of Synchrotron Radiation Journal of Synchrotron Radiation, International Union of Crystallography, 2019, 26 (4), pp.1374-1387. ⟨10.1107/S1600577519003722⟩ |
| بيانات النشر: | HAL CCSD, 2019. |
| سنة النشر: | 2019 |
| مصطلحات موضوعية: | Diffraction, Nuclear and High Energy Physics, Materials science, Ultra-high vacuum, 02 engineering and technology, X-ray absorption (XAS), 01 natural sciences, tender X-rays, law.invention, Optics, law, diffractometers, 0103 physical sciences, [CHIM]Chemical Sciences, [PHYS.COND]Physics [physics]/Condensed Matter [cond-mat], Spectroscopy, Instrumentation, Diffractometer, diffraction anomalous fine structure (DAFS), 010302 applied physics, X-ray absorption spectroscopy, Radiation, business.industry, [CHIM.MATE]Chemical Sciences/Material chemistry, 021001 nanoscience & nanotechnology, Synchrotron, Beamline, functional oxides, X-ray crystallography, 0210 nano-technology, business |
| الوصف: | A new high-vacuum multipurpose diffractometer (called FORTE from the French acronyms of the project) has recently been installed at the tender/hard X-ray SIRIUS beamline of Synchrotron SOLEIL, France. The geometry chosen allows one to work either in the classical Eulerian four-circle geometry for bulk X-ray diffraction (XRD) or in the z-axis geometry for surface XRD. The diffractometer nicely fits the characteristics of the SIRIUS beamline, optimized to work in the 1.1–4.5 keV range, and allows one to perform unprecedented diffraction anomalous fine structure (DAFS) experiments in the tender X-ray region, also around non-specular reflections, covering a large reciprocal-space volume. Installation of an X-ray fluorescence detector on a dedicated flange allows simultaneous DAFS and X-ray absorption (XAS) measurements. The access to the tender X-ray region paves the way to resonant investigations around the L-edges of second-row transition elements which are constituents of functional oxide materials. It also enables access to several edges of interest for semiconductors. Finally, the control architecture based on synchronized Delta Tau units opens up exciting perspectives for improvement of the mechanical sphere of confusion. |
| اللغة: | English |
| تدمد: | 0909-0495 1600-5775 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6c1bccf0fe10a026b334fd52392d5a40 https://hal-normandie-univ.archives-ouvertes.fr/hal-02264671/document |
| حقوق: | OPEN |
| رقم الأكسشن: | edsair.doi.dedup.....6c1bccf0fe10a026b334fd52392d5a40 |
| قاعدة البيانات: | OpenAIRE |
| تدمد: | 09090495 16005775 |
|---|