Monte-Carlo-Based Estimation of the X-ray Energy Spectrum for CT Artifact Reduction
| العنوان: | Monte-Carlo-Based Estimation of the X-ray Energy Spectrum for CT Artifact Reduction |
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| المؤلفون: | Nathanael Six, Jan Sijbers, Björn De Samber, Domenico Iuso, Ehsan Nazemi, Jan De Beenhouwer |
| المصدر: | Applied Sciences Volume 11 Issue 7 Applied Sciences, Vol 11, Iss 3145, p 3145 (2021) |
| بيانات النشر: | Multidisciplinary Digital Publishing Institute, 2021. |
| سنة النشر: | 2021 |
| مصطلحات موضوعية: | Image quality, Monte Carlo method, Iterative reconstruction, lcsh:Technology, Flat panel detector, 030218 nuclear medicine & medical imaging, lcsh:Chemistry, 03 medical and health sciences, 0302 clinical medicine, Expectation–maximization algorithm, FleXCT, General Materials Science, Instrumentation, lcsh:QH301-705.5, Expectation Maximization, Monte Carlo simulation, Fluid Flow and Transfer Processes, Physics, Scattering, lcsh:T, Process Chemistry and Technology, Detector, General Engineering, imaging system, lcsh:QC1-999, Computer Science Applications, Computational physics, Chemistry, lcsh:Biology (General), lcsh:QD1-999, lcsh:TA1-2040, 030220 oncology & carcinogenesis, X-ray energy spectrum, lcsh:Engineering (General). Civil engineering (General), Energy (signal processing), lcsh:Physics |
| الوصف: | Beam hardening and scattering effects can seriously degrade image quality in polychromatic X-ray CT imaging. In recent years, polychromatic image reconstruction techniques and scatter estimation using Monte Carlo simulation have been developed to compensate for beam hardening and scattering CT artifacts, respectively. Both techniques require knowledge of the X-ray tube energy spectrum. In this work, Monte Carlo simulations were used to calculate the X-ray energy spectrum of FleXCT, a novel prototype industrial micro-CT scanner, enabling beam hardening and scatter reduction for CT experiments. Both source and detector were completely modeled by Monte Carlo simulation. In order to validate the energy spectra obtained via Monte Carlo simulation, they were compared with energy spectra obtained via a second method. Here, energy spectra were calculated from empirical measurements using a step wedge sample, in combination with the Maximum Likelihood Expectation Maximization (MLEM) method. Good correlation was achieved between both approaches, confirming the correct modeling of the FleXCT system by Monte Carlo simulation. After validation of the modeled FleXCT system through comparing the X-ray spectra for different tube voltages inside the detector, we calculated the X-ray spectrum of the FleXCT X-ray tube, independent of the flat panel detector response, which is a prerequisite for beam hardening and scattering CT artifacts. |
| وصف الملف: | application/pdf |
| اللغة: | English |
| تدمد: | 2076-3417 |
| DOI: | 10.3390/app11073145 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8553d49ec054b9da31fc0e0f17904c46 |
| حقوق: | OPEN |
| رقم الأكسشن: | edsair.doi.dedup.....8553d49ec054b9da31fc0e0f17904c46 |
| قاعدة البيانات: | OpenAIRE |
| تدمد: | 20763417 |
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| DOI: | 10.3390/app11073145 |