High resolution magnetic patterning using Focused Ion Beam irradiation

التفاصيل البيبلوغرافية
العنوان: High resolution magnetic patterning using Focused Ion Beam irradiation
المؤلفون: T. Aign, Jacques Gierak, Claude Chappert, H. Launois, P. Meyer, J.-P. Jamet, H. Bernas, V. Mathet, Christophe Vieu, Jacques Ferré
المساهمون: Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse (CSNSM), Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11), Lorgeril, Jocelyne
المصدر: Microelectronic Engineering
Microelectronic Engineering, Elsevier, 2000, 53, pp.191-194
بيانات النشر: Elsevier BV, 2000.
سنة النشر: 2000
مصطلحات موضوعية: Mixing (process engineering), 02 engineering and technology, 01 natural sciences, Focused ion beam, Ion, Condensed Matter::Materials Science, 0103 physical sciences, Irradiation, Electrical and Electronic Engineering, 010302 applied physics, Condensed matter physics, business.industry, Chemistry, Resolution (electron density), Coercivity, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Optoelectronics, Curie temperature, 0210 nano-technology, business, human activities, Layer (electronics)
الوصف: We show how Focused Ion Beam irradiation can be used to modify the magnetic properties of a thin Co/Pt layer at a nanometric length-scale. The control of the injected ion dose enables the adjustment of the coercive field and the Curie temperature of the layer on localized parts of the sample. The mechanism induced during irradiation is identified as a collisional mixing process which incorporates some Pt into the Co layer thus lowering the Curie temperature. The ultimate resolution of this magnetic patterning technique is discussed.
تدمد: 0167-9317
1873-5568
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::aa85b512b031082cd31242b4531709e6
https://doi.org/10.1016/s0167-9317(00)00294-x
حقوق: CLOSED
رقم الأكسشن: edsair.doi.dedup.....aa85b512b031082cd31242b4531709e6
قاعدة البيانات: OpenAIRE