High resolution magnetic patterning using Focused Ion Beam irradiation
العنوان: | High resolution magnetic patterning using Focused Ion Beam irradiation |
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المؤلفون: | T. Aign, Jacques Gierak, Claude Chappert, H. Launois, P. Meyer, J.-P. Jamet, H. Bernas, V. Mathet, Christophe Vieu, Jacques Ferré |
المساهمون: | Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse (CSNSM), Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11), Lorgeril, Jocelyne |
المصدر: | Microelectronic Engineering Microelectronic Engineering, Elsevier, 2000, 53, pp.191-194 |
بيانات النشر: | Elsevier BV, 2000. |
سنة النشر: | 2000 |
مصطلحات موضوعية: | Mixing (process engineering), 02 engineering and technology, 01 natural sciences, Focused ion beam, Ion, Condensed Matter::Materials Science, 0103 physical sciences, Irradiation, Electrical and Electronic Engineering, 010302 applied physics, Condensed matter physics, business.industry, Chemistry, Resolution (electron density), Coercivity, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Optoelectronics, Curie temperature, 0210 nano-technology, business, human activities, Layer (electronics) |
الوصف: | We show how Focused Ion Beam irradiation can be used to modify the magnetic properties of a thin Co/Pt layer at a nanometric length-scale. The control of the injected ion dose enables the adjustment of the coercive field and the Curie temperature of the layer on localized parts of the sample. The mechanism induced during irradiation is identified as a collisional mixing process which incorporates some Pt into the Co layer thus lowering the Curie temperature. The ultimate resolution of this magnetic patterning technique is discussed. |
تدمد: | 0167-9317 1873-5568 |
URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_dedup___::aa85b512b031082cd31242b4531709e6 https://doi.org/10.1016/s0167-9317(00)00294-x |
حقوق: | CLOSED |
رقم الأكسشن: | edsair.doi.dedup.....aa85b512b031082cd31242b4531709e6 |
قاعدة البيانات: | OpenAIRE |
تدمد: | 01679317 18735568 |
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