EDEPR of impurity centers embedded in silicon microcavities

التفاصيل البيبلوغرافية
العنوان: EDEPR of impurity centers embedded in silicon microcavities
المؤلفون: Bagraev, N. T., Gehlhoff, W., Gets, D. S., Klyachkin, L. E., Kudryavtsev, A. A., Malyarenko, A. M., Mashkov, V. A., Romanov, V. V.
سنة النشر: 2009
المجموعة: Condensed Matter
مصطلحات موضوعية: Condensed Matter - Mesoscale and Nanoscale Physics, Condensed Matter - Superconductivity
الوصف: We present the first findings of the new electrically-detected EPR (EDEPR) technique which reveal different shallow and deep centers without using the external cavity as well as the hf source and recorder, with measuring the only magnetoresistance of the Si-QW confined by the superconductor delta-barriers.
Comment: 7 pages, 7 figures
نوع الوثيقة: Working Paper
DOI: 10.1016/j.physb.2009.08.247
URL الوصول: http://arxiv.org/abs/0910.3851
رقم الأكسشن: edsarx.0910.3851
قاعدة البيانات: arXiv
الوصف
DOI:10.1016/j.physb.2009.08.247