تقرير
Quantifying defects in graphene via Raman spectroscopy at different excitation energies
| العنوان: | Quantifying defects in graphene via Raman spectroscopy at different excitation energies |
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| المؤلفون: | Cançado, L. G., Jorio, A., Ferreira, E. H. Martins, Stavale, F., Achete, C. A., Capaz, R. B., Moutinho, M. V. O., Lombardo, A., Kulmala, T., Ferrari, A. C. |
| المصدر: | Nano Letters 11, 3190 (2011) |
| سنة النشر: | 2011 |
| المجموعة: | Condensed Matter |
| مصطلحات موضوعية: | Condensed Matter - Materials Science, Condensed Matter - Mesoscale and Nanoscale Physics |
| الوصف: | We present a Raman study of Ar(+)-bombarded graphene samples with increasing ion doses. This allows us to have a controlled, increasing, amount of defects. We find that the ratio between the D and G peak intensities for a given defect density strongly depends on the laser excitation energy. We quantify this effect and present a simple equation for the determination of the point defect density in graphene via Raman spectroscopy for any visible excitation energy. We note that, for all excitations, the D to G intensity ratio reaches a maximum for an inter-defect distance ~3nm. Thus, a given ratio could correspond to two different defect densities, above or below the maximum. The analysis of the G peak width and its dispersion with excitation energy solves this ambiguity. Comment: Fixed numerical factors in equations (5) and (6) |
| نوع الوثيقة: | Working Paper |
| DOI: | 10.1021/nl201432g |
| URL الوصول: | http://arxiv.org/abs/1105.0175 |
| رقم الأكسشن: | edsarx.1105.0175 |
| قاعدة البيانات: | arXiv |
| DOI: | 10.1021/nl201432g |
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