تقرير
Robust method to determine the resolution of a superlens by analyzing the near-field image of a two-slit object
| العنوان: | Robust method to determine the resolution of a superlens by analyzing the near-field image of a two-slit object |
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| المؤلفون: | Casse, B. D. F., Lu, W. T., Huang, Y. J., Sridhar, S. |
| سنة النشر: | 2011 |
| المجموعة: | Condensed Matter Physics (Other) |
| مصطلحات موضوعية: | Physics - Optics, Condensed Matter - Other Condensed Matter |
| الوصف: | In the last decade, metamaterials-based superlenses, with a resolution below Abbe's diffraction limit, have emerged. To obtain a rough estimate of the resolution of such superlenses, imaging of two subwavelength slits, separated by a subwavelength gap \textit{d} is typically performed. The resolution $\Delta$ of the lens corresponds to the minimum possible gap $d_{min}$ for which a distinct image of the two slits can be resolved ($\Delta \sim d_{min}$). In this letter, we present a more quantitative estimate of the resolution of manufactured lenses by fitting analytical near-field image profiles, obtained from imaging a two-slit object with a theoretical negative-index lens of known resolution, to experimental data. We conclude the discussion by applying our analytical method to 3 case examples of superlensing from the literature. As shown, this method is particularly attractive for rapidly assessing the performance of fabricated superresolution lenses. Comment: 10 pages, 4 figures |
| نوع الوثيقة: | Working Paper |
| URL الوصول: | http://arxiv.org/abs/1105.0182 |
| رقم الأكسشن: | edsarx.1105.0182 |
| قاعدة البيانات: | arXiv |
| الوصف غير متاح. |