Fabrication of stable and reproducible sub-micron tunnel junctions

التفاصيل البيبلوغرافية
العنوان: Fabrication of stable and reproducible sub-micron tunnel junctions
المؤلفون: Pop, I. M., Fournier, T., Crozes, T., Lecocq, F., Matei, I., Pannetier, B., Buisson, O., Guichard, W.
سنة النشر: 2011
المجموعة: Condensed Matter
مصطلحات موضوعية: Condensed Matter - Mesoscale and Nanoscale Physics, Condensed Matter - Superconductivity
الوصف: We have performed a detailed study of the time stability and reproducibility of sub-micron $Al/AlO_{x}/Al$ tunnel junctions, fabricated using standard double angle shadow evaporations. We have found that by aggressively cleaning the substrate before the evaporations, thus preventing any contamination of the junction, we obtained perfectly stable oxide barriers. We also present measurements on large ensembles of junctions which prove the reproducibility of the fabrication process. The measured tunnel resistance variance in large ensembles of identically fabricated junctions is in the range of only a few percents. Finally, we have studied the effect of different thermal treatments on the junction barrier. This is especially important for multiple step fabrication processes which imply annealing the junction.
Comment: 4 pages, 3 figures
نوع الوثيقة: Working Paper
DOI: 10.1116/1.3673790
URL الوصول: http://arxiv.org/abs/1105.6204
رقم الأكسشن: edsarx.1105.6204
قاعدة البيانات: arXiv