تقرير
A comprehensive analysis of the (R13xR13)R13.9{\deg} type II structure of silicene on Ag(111)
| العنوان: | A comprehensive analysis of the (R13xR13)R13.9{\deg} type II structure of silicene on Ag(111) |
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| المؤلفون: | Jamgotchian, H., Ealet, B., Maradj, H., Hoarau, J. -Y., Biberian, J. -P., Aufray, B. |
| سنة النشر: | 2015 |
| المجموعة: | Condensed Matter |
| مصطلحات موضوعية: | Condensed Matter - Materials Science |
| الوصف: | In this paper, using the same geometrical approach than for the (2R3x2R3) R30{\deg} structure (H. Jamgotchian et al., 2015, Journal of Physics. Condensed Matter 27 395002), for the (R13xR13)R13.9{\deg} type II structure, we propose an atomic model of the silicene layer based on a periodic relaxation of the strain epitaxy. This relaxation creates periodic arrangements of perfect areas of (R13xR13)R13.9{\deg} type II structure surrounded by defect areas. A detailed analysis of the main published experimental results, obtained by Scanning Tunneling Microscopy and by Low Energy Electron Diffraction, shows a good agreement with the geometrical model. Comment: 20 pages, 9 figures |
| نوع الوثيقة: | Working Paper |
| DOI: | 10.1088/0953-8984/28/19/195002 |
| URL الوصول: | http://arxiv.org/abs/1507.08884 |
| رقم الأكسشن: | edsarx.1507.08884 |
| قاعدة البيانات: | arXiv |
| DOI: | 10.1088/0953-8984/28/19/195002 |
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