Bayesian electron density inference from JET lithium beam emission spectra using Gaussian processes

التفاصيل البيبلوغرافية
العنوان: Bayesian electron density inference from JET lithium beam emission spectra using Gaussian processes
المؤلفون: Kwak, Sehyun, Svensson, J., Brix, M., Ghim, Y. -c.
سنة النشر: 2016
المجموعة: Physics (Other)
مصطلحات موضوعية: Physics - Plasma Physics
الوصف: A Bayesian model to infer edge electron density profiles is developed for the JET lithium beam emission spectroscopy system, measuring Li I line radiation using 26 channels with ~1 cm spatial resolution and 10~20 ms temporal resolution. The density profile is modelled using a Gaussian process prior, and the uncertainty of the density profile is calculated by a Markov Chain Monte Carlo (MCMC) scheme. From the spectra measured by the transmission grating spectrometer, the Li line intensities are extracted, and modelled as a function of the plasma density by a multi-state model which describes the relevant processes between neutral lithium beam atoms and plasma particles. The spectral model fully takes into account interference filter and instrument effects, that are separately estimated, again using Gaussian processes. The line intensities are inferred based on a spectral model consistent with the measured spectra within their uncertainties, which includes photon statistics and electronic noise. Our newly developed method to infer JET edge electron density profiles has the following advantages in comparison to the conventional method: i) providing full posterior distributions of edge density profiles, including their associated uncertainties, ii) the available radial range for density profiles is increased to the full observation range (~26 cm), iii) an assumption of monotonic electron density profile is not necessary, iv) the absolute calibration factor of the diagnostic system is automatically estimated overcoming the limitation of the conventional technique and allowing us to infer the electron density profiles for all pulses without preprocessing the data or an additional boundary condition, and v) since the full spectrum is modelled, the procedure of modulating the beam to measure the background signal is only necessary for the case of overlapping of the Li line with impurity lines.
Comment: 18 pages and 8 figures
نوع الوثيقة: Working Paper
DOI: 10.1088/1741-4326/aa5072
URL الوصول: http://arxiv.org/abs/1609.03787
رقم الأكسشن: edsarx.1609.03787
قاعدة البيانات: arXiv
الوصف
DOI:10.1088/1741-4326/aa5072