Secondary ion mass spectrometry for SRF cavity materials

التفاصيل البيبلوغرافية
العنوان: Secondary ion mass spectrometry for SRF cavity materials
المؤلفون: Tuggle, J., Pudasaini, U., Palczewski, A. S., Reece, C. E., Stevie, F. A., Kelley, M. J.
سنة النشر: 2018
المجموعة: Physics (Other)
مصطلحات موضوعية: Physics - Accelerator Physics
الوصف: Historically, many advances in superconducting radio frequency (SRF) cavities destined for use in advanced particle accelerators have come empirically, through the iterative procedure of modifying processing and then performance testing. However, material structure is directly responsible for performance. Understanding, the link between processing, structure, and performance will streamline and accelerate the research process. In order to connect processing, structure, and performance, accurate and robust materials characterization methods are needed. Here one such method, SIMS, is discussed with focus on analysis of SRF materials. In addition, several examples are presented, showing how SIMS is being used to further understanding of materials based SRF technologies.
نوع الوثيقة: Working Paper
URL الوصول: http://arxiv.org/abs/1803.07598
رقم الأكسشن: edsarx.1803.07598
قاعدة البيانات: arXiv