تقرير
Analyzing Uncertainty Matrices Associated with Multiple S-parameter Measurements
| العنوان: | Analyzing Uncertainty Matrices Associated with Multiple S-parameter Measurements |
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| المؤلفون: | Ridler, Nick M., Salter, Martin J. |
| سنة النشر: | 2018 |
| المجموعة: | Physics (Other) |
| مصطلحات موضوعية: | Physics - Instrumentation and Detectors |
| الوصف: | This paper presents a detailed analysis of uncertainty matrices (i.e. measurement covariance matrices) associated with multiple complex-valued microwave scattering S-parameter measurements. The analysis is based on forming combinations of (2 X 2) sub-matrices from selected elements in the uncertainty matrix and using these sub-matrices to define uncertainty ellipses in two-dimensional measurement planes. These uncertainty ellipses can be used to assess the quality, accuracy and validity of the measurements. A simple example is given using measurements made on a waveguide mismatched line section at frequencies from 75 GHz to 110 GHz. The analysis is also useful when multiple S-parameter measurements are used as input quantities for measurement models used to determine other measurement quantities (i.e. as output quantities). Comment: 2015 85th Microwave Measurement Conference (ARFTG) |
| نوع الوثيقة: | Working Paper |
| DOI: | 10.1109/ARFTG.2015.7162898 |
| URL الوصول: | http://arxiv.org/abs/1809.07297 |
| رقم الأكسشن: | edsarx.1809.07297 |
| قاعدة البيانات: | arXiv |
| DOI: | 10.1109/ARFTG.2015.7162898 |
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