تقرير
Total internal reflection based super-resolution imaging for sub-IR frequencies
| العنوان: | Total internal reflection based super-resolution imaging for sub-IR frequencies |
|---|---|
| المؤلفون: | Barr, Lauren E., Karlsen, Peter, Hornett, Samuel M., Hooper, Ian R., Mrnka, Michal, Lawrence, Christopher R., Phillips, David B., Hendry, Euan |
| سنة النشر: | 2020 |
| المجموعة: | Physics (Other) |
| مصطلحات موضوعية: | Physics - Applied Physics, Physics - Instrumentation and Detectors, Physics - Optics |
| الوصف: | For measurements designed to accurately determine layer thickness, there is a natural trade-off between sensitivity to optical thickness and lateral resolution due to the angular ray distribution required for a focused beam. We demonstrate a near-field imaging approach that enables both sub-wavelength lateral resolution and optical thickness sensitivity. We illuminate a sample in a total internal reflection geometry, with a photo-activated spatial modulator in the near-field, which allows optical thickness images to be computationally reconstructed in a few seconds. We demonstrate our approach at 140 GHz (wavelength 2.15 mm), where images are normally severely limited in spatial resolution, and demonstrate mapping of optical thickness variation in inhomogeneous biological tissues. Comment: Main text has 13 pages & 4 figures |
| نوع الوثيقة: | Working Paper |
| URL الوصول: | http://arxiv.org/abs/2006.02091 |
| رقم الأكسشن: | edsarx.2006.02091 |
| قاعدة البيانات: | arXiv |
| الوصف غير متاح. |