Magnetoresistance and Kondo effect in the nodal-line semimetal VAs$_2$

التفاصيل البيبلوغرافية
العنوان: Magnetoresistance and Kondo effect in the nodal-line semimetal VAs$_2$
المؤلفون: Chen, Shuijin, Lou, Zhefeng, Zhou, Yuxing, Chen, Qin, Xu, Binjie, Du, Jianhua, Yang, Jinhu, Wang, Haangdong, Fang, Minghu
المصدر: CHIN. PHYS. LETT. 38, 017202 (2021)
سنة النشر: 2020
المجموعة: Condensed Matter
مصطلحات موضوعية: Condensed Matter - Strongly Correlated Electrons
الوصف: We performed calculations of the electronic band structure and the Fermi surface as well as measured the longitudinal resistivity $\rho_{xx}(T,H)$, Hall resistivity $\rho_{xy}(T,H)$, and magnetic susceptibility as a function of temperature and various magnetic fields for VAs$_2$ with a monoclinic crystal structure. The band structure calculations show that VAs$_2$ is a nodal-line semimetal when spin-orbit coupling is ignored. The emergence of a minimum at around 11 K in $\rho_{xx}(T)$ measured at $H$ = 0 demonstrates that an additional magnetic impurity (V$^{4+}$, $S$ = 1/2) occurs in VAs$_2$ single crystals, evidenced by both the fitting of $\rho_{xx}(T)$ data and the susceptibility measurements. It was found that a large positive magnetoresistance (MR) reaching 649\% at 10 K and 9 T, its nearly quadratic field dependence, and a field-induced up-turn behavior of $\rho_{xx}(T)$ emerge also in VAs$_2$, although MR is not so large due to the existence of additional scattering compared with other topological nontrival/trival semimetals. The observed properties are attributed to a perfect charge-carrier compensation, which is evidenced by both calculations relying on the Fermi surface and the Hall resistivity measurements. These results indicate that the compounds containing V ($3d^3 4s^2$) element as a platform for studying the influence of magnetic impurities to the topological properties.
Comment: 8 pages, 5 figures. arXiv admin note: text overlap with arXiv:2007.04814
نوع الوثيقة: Working Paper
DOI: 10.1088/0256-307X/38/1/017202
URL الوصول: http://arxiv.org/abs/2012.11997
رقم الأكسشن: edsarx.2012.11997
قاعدة البيانات: arXiv
الوصف
DOI:10.1088/0256-307X/38/1/017202