تقرير
High-precision mapping of diamond crystal strain using quantum interferometry
| العنوان: | High-precision mapping of diamond crystal strain using quantum interferometry |
|---|---|
| المؤلفون: | Marshall, Mason C., Ebadi, Reza, Hart, Connor, Turner, Matthew J., Ku, Mark J. H., Phillips, David F., Walsworth, Ronald L. |
| المصدر: | Phys. Rev. Applied 17, 024041 (2022) |
| سنة النشر: | 2021 |
| المجموعة: | Condensed Matter High Energy Physics - Experiment Physics (Other) Quantum Physics |
| مصطلحات موضوعية: | Quantum Physics, Condensed Matter - Materials Science, High Energy Physics - Experiment, Physics - Applied Physics, Physics - Instrumentation and Detectors |
| الوصف: | Crystal strain variation imposes significant limitations on many quantum sensing and information applications for solid-state defect qubits in diamond. Thus, precision measurement and control of diamond crystal strain is a key challenge. Here, we report diamond strain measurements with a unique set of capabilities, including micron-scale spatial resolution, millimeter-scale field-of-view, and a two order-of-magnitude improvement in volume-normalized sensitivity over previous work [1], reaching $5(2) \times 10^{-8}/\sqrt{\rm{Hz}\cdot\rm{\mu m}^3}$ (with spin-strain coupling coefficients representing the dominant systematic uncertainty). We use strain-sensitive spin-state interferometry on ensembles of nitrogen vacancy (NV) color centers in single-crystal CVD bulk diamond with low strain gradients. This quantum interferometry technique provides insensitivity to magnetic-field inhomogeneity from the electronic and nuclear spin bath, thereby enabling long NV ensemble electronic spin dephasing times and enhanced strain sensitivity. We demonstrate the strain-sensitive measurement protocol first on a scanning confocal laser microscope, providing quantitative measurement of sensitivity as well as three-dimensional strain mapping; and second on a wide-field imaging quantum diamond microscope (QDM). Our strain microscopy technique enables fast, sensitive characterization for diamond material engineering and nanofabrication; as well as diamond-based sensing of strains applied externally, as in diamond anvil cells or embedded diamond stress sensors, or internally, as by crystal damage due to particle-induced nuclear recoils. Comment: 14 pages, 8 figures |
| نوع الوثيقة: | Working Paper |
| DOI: | 10.1103/PhysRevApplied.17.024041 |
| URL الوصول: | http://arxiv.org/abs/2108.00304 |
| رقم الأكسشن: | edsarx.2108.00304 |
| قاعدة البيانات: | arXiv |
| DOI: | 10.1103/PhysRevApplied.17.024041 |
|---|