تقرير
Liquid Metal Printed Ultrathin Oxides for Monolayer WS2 Top-Gate Transistors
العنوان: | Liquid Metal Printed Ultrathin Oxides for Monolayer WS2 Top-Gate Transistors |
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المؤلفون: | Zhang, Yiyu, Venkatakrishnarao, Dasari, Bosman, Michel, Fu, Wei, Das, Sarthak, Bussolotti, Fabio, Lee, Rainer, Teo, Siew Lang, Huang, Ding, Verzhbitskiy, Ivan, Jiang, Zhuojun, Jiang, Zhuoling, Chai, Jian Wei, Tong, Shi Wun, Ooi, Zi-En, Wong, Calvin Pei Yu, Ang, Yee Sin, Goh, Kuan Eng Johnson, Lau, Chit Siong |
سنة النشر: | 2022 |
المجموعة: | Condensed Matter Physics (Other) |
مصطلحات موضوعية: | Condensed Matter - Materials Science, Condensed Matter - Mesoscale and Nanoscale Physics, Physics - Applied Physics, Physics - Chemical Physics |
الوصف: | Two-dimensional (2D) semiconductors are promising channel materials for continued downscaling of complementary metal-oxide-semiconductor (CMOS) logic circuits. However, their full potential continues to be limited by a lack of scalable high-k dielectrics that can achieve atomically smooth interfaces, small equivalent oxide thicknesses (EOT), excellent gate control, and low leakage currents. Here, we report liquid metal printed ultrathin and scalable Ga2O3 dielectric for 2D electronics and electro-optical devices. We directly visualize the atomically smooth Ga2O3/WS2 interfaces enabled by the conformal nature of liquid metal printing. We demonstrate atomic layer deposition compatibility with high-k Ga2O3/HfO2 top-gate dielectric stacks on chemical vapour deposition grown monolayer WS2, achieving EOTs of ~1 nm and subthreshold swings down to 84.9 mV/dec. Gate leakage currents are well within requirements for ultra-scaled low-power logic circuits. Our results show that liquid metal printed oxides can bridge a crucial gap in scalable dielectric integration of 2D materials for next-generation nano-electronics. |
نوع الوثيقة: | Working Paper |
URL الوصول: | http://arxiv.org/abs/2210.14426 |
رقم الأكسشن: | edsarx.2210.14426 |
قاعدة البيانات: | arXiv |
الوصف غير متاح. |