Blocking transition of interface traps in MoS$_2$-on-SiO$_2$ FETs

التفاصيل البيبلوغرافية
العنوان: Blocking transition of interface traps in MoS$_2$-on-SiO$_2$ FETs
المؤلفون: Jana, Santu Prasad, Gupta, Suraina, Gupta, Anjan K.
المصدر: Phys. Rev. B 108, 195411 (2023)
سنة النشر: 2023
المجموعة: Condensed Matter
مصطلحات موضوعية: Condensed Matter - Mesoscale and Nanoscale Physics, Condensed Matter - Materials Science
الوصف: Electrical conductivity with gate-sweep in a few layer MoS$_2$-on-SiO$_2$ field-effect-transistor shows an abrupt reduction in hysteresis when cooled. The hysteresis and time dependent conductivity of the MoS$_2$ channel are modeled using the dynamics of interface traps' occupancy. The reduction in hysteresis is found to be steepest at a blocking temperature near 225 K. This is attributed to the interplay between thermal and barrier energies and fitted using a distribution of the latter. Further, the charge stored in the blocked traps is programmed at low temperatures by cooling under suitable gate voltage. Thus the threshold gate-voltage in nearly non-hysteretic devices at 80 K temperature is reversibly controlled over a wide range.
Comment: 14 pages, 13 figures
نوع الوثيقة: Working Paper
DOI: 10.1103/PhysRevB.108.195411
URL الوصول: http://arxiv.org/abs/2303.13902
رقم الأكسشن: edsarx.2303.13902
قاعدة البيانات: arXiv
الوصف
DOI:10.1103/PhysRevB.108.195411