Thin-film lithium niobate (TFLN) based frequency doublers have been widely recognized as essential components for both classical and quantum optical communications. Nonetheless, the efficiency of these devices is hindered by imperfections present in the quasi-phase matching (QPM) spectrum. In this study, we present a thorough analysis of the spectral imperfections in TFLN frequency doublers with varying lengths, ranging from 5 mm to 15 mm. Employing a non-destructive diagnostic method based on scattered light imaging, we identify the sources and waveguide sections that contribute to the imperfections in the QPM spectrum. Furthermore, by mapping the TFLN film thickness across the entire waveguiding regions, we successfully reproduce the QPM spectra numerically, thus confirming the prominent influence of film thickness variations on the observed spectral imperfections. This comprehensive investigation provides valuable insights into the identification and mitigation of spectral imperfections in TFLN-based frequency doublers, paving the way toward the realization of nonlinear optical devices with enhanced efficiency and improved spectral fidelity.
