Characterizing non-Markovian Quantum Process by Fast Bayesian Tomography

التفاصيل البيبلوغرافية
العنوان: Characterizing non-Markovian Quantum Process by Fast Bayesian Tomography
المؤلفون: Su, R. Y., Huang, J. Y., Stuyck, N. Dumoulin., Feng, M. K., Gilbert, W., Evans, T. J., Lim, W. H., Hudson, F. E., Chan, K. W., Huang, W., Itoh, Kohei M., Harper, R., Bartlett, S. D., Yang, C. H., Laucht, A., Saraiva, A., Tanttu, T., Dzurak, A. S.
سنة النشر: 2023
المجموعة: Condensed Matter
Quantum Physics
مصطلحات موضوعية: Quantum Physics, Condensed Matter - Mesoscale and Nanoscale Physics
الوصف: To push gate performance to levels beyond the thresholds for quantum error correction, it is important to characterize the error sources occurring on quantum gates. However, the characterization of non-Markovian error poses a challenge to current quantum process tomography techniques. Fast Bayesian Tomography (FBT) is a self-consistent gate set tomography protocol that can be bootstrapped from earlier characterization knowledge and be updated in real-time with arbitrary gate sequences. Here we demonstrate how FBT allows for the characterization of key non-Markovian error processes. We introduce two experimental protocols for FBT to diagnose the non-Markovian behavior of two-qubit systems on silicon quantum dots. To increase the efficiency and scalability of the experiment-analysis loop, we develop an online FBT software stack. To reduce experiment cost and analysis time, we also introduce a native readout method and warm boot strategy. Our results demonstrate that FBT is a useful tool for probing non-Markovian errors that can be detrimental to the ultimate realization of fault-tolerant operation on quantum computing.
نوع الوثيقة: Working Paper
URL الوصول: http://arxiv.org/abs/2307.12452
رقم الأكسشن: edsarx.2307.12452
قاعدة البيانات: arXiv