تقرير
Moir\'e plane wave expansion model for scanning tunneling microscopy simulations of incommensurate two-dimensional materials
العنوان: | Moir\'e plane wave expansion model for scanning tunneling microscopy simulations of incommensurate two-dimensional materials |
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المؤلفون: | Ster, Maxime Le, Dabrowski, Paweł, Krukowski, Paweł, Rogala, Maciej, Lutsyk, Iaroslav, Ryś, Wojciech, Märkl, Tobias, Brown, Simon A., Sławińska, Jagoda, Palotás, Krisztián, Kowalczyk, Paweł J. |
سنة النشر: | 2023 |
المجموعة: | Condensed Matter |
مصطلحات موضوعية: | Condensed Matter - Mesoscale and Nanoscale Physics |
الوصف: | Incommensurate heterostructures of two-dimensional (2D) materials, despite their attractive electronic behaviour, are challenging to simulate because of the absence of translation symmetry. Experimental investigations of these structures often employ scanning tunneling microscopy (STM), however there is to date no comprehensive theory to simulate an STM image in such systems. In this paper, we present a geometry-based method to generate STM images in incommensurate van der Waals (vdW) heterostructures, which we call the moir\'e plane wave expansion model (MPWEM). We generate the STM images using a weighted sum of three image terms: the non-interacting STM images of (1) the substrate layer, (2) the adsorbate layer, and (3) a semi-empirical Fourier expansion of the moir\'e wavevectors obtained analytically which results from the interaction of (1) and (2). We illustrate and benchmark the model using selected vdW 2D systems composed of structurally and electronically distinct crystals, and show that the method reproduces experimental STM images down to angstrom-scale details. The MPWEM, thanks to its simplicity, can serve as an initial prediction tool prior to more computationally expensive calculations which are often limited by the number of atoms and the requirement of periodic supercells, and thus offers a promising class of computationally-friendly STM simulations, of high relevance in the growing field of twistronics. Comment: 12 pages, 5 figures (+ supplementary information) |
نوع الوثيقة: | Working Paper |
URL الوصول: | http://arxiv.org/abs/2310.06535 |
رقم الأكسشن: | edsarx.2310.06535 |
قاعدة البيانات: | arXiv |
الوصف غير متاح. |