Ultrahigh Resolution X-ray Thomson Scattering Measurements at the European XFEL

التفاصيل البيبلوغرافية
العنوان: Ultrahigh Resolution X-ray Thomson Scattering Measurements at the European XFEL
المؤلفون: Gawne, Thomas, Moldabekov, Zhandos A., Humphries, Oliver S., Appel, Karen, Bähtz, Carsten, Bouffetier, Victorien, Brambrink, Erik, Cangi, Attila, Göde, Sebastian, Konôpková, Zuzana, Makita, Mikako, Mishchenko, Mikhail, Nakatsutsumi, Motoaki, Ramakrishna, Kushal, Randolph, Lisa, Schwalbe, Sebastian, Vorberger, Jan, Wollenweber, Lennart, Zastrau, Ulf, Dornheim, Tobias, Preston, Thomas R.
سنة النشر: 2024
المجموعة: Physics (Other)
مصطلحات موضوعية: Physics - Plasma Physics
الوصف: Using a novel ultrahigh resolution ($\Delta E \sim 0.1\,$eV) setup to measure electronic features in x-ray Thomson scattering (XRTS) experiments at the European XFEL in Germany, we have studied the collective plasmon excitation in aluminium at ambient conditions, which we can measure very accurately even at low momentum transfers. As a result, we can resolve previously reported discrepancies between ab initio time-dependent density functional theory simulations and experimental observations. The demonstrated capability for high-resolution XRTS measurements will be a game changer for the diagnosis of experiments with matter under extreme densities, temperatures, and pressures, and unlock the full potential of state-of-the-art x-ray free electron laser (XFEL) facilities to study planetary interior conditions, to understand inertial confinement fusion applications, and for material science and discovery.
نوع الوثيقة: Working Paper
URL الوصول: http://arxiv.org/abs/2403.02776
رقم الأكسشن: edsarx.2403.02776
قاعدة البيانات: arXiv