Extended spin relaxation times of optically addressed telecom defects in silicon carbide

التفاصيل البيبلوغرافية
العنوان: Extended spin relaxation times of optically addressed telecom defects in silicon carbide
المؤلفون: Ahn, Jonghoon, Wicker, Christina, Bitner, Nolan, Solomon, Michael T., Tissot, Benedikt, Burkard, Guido, Dibos, Alan M., Zhang, Jiefei, Heremans, F. Joseph, Awschalom, David D.
سنة النشر: 2024
المجموعة: Condensed Matter
Quantum Physics
مصطلحات موضوعية: Quantum Physics, Condensed Matter - Materials Science
الوصف: Optically interfaced solid-state defects are promising candidates for quantum communication technologies. The ideal defect system would feature bright telecom emission, long-lived spin states, and a scalable material platform, simultaneously. Here, we employ one such system, vanadium (V4+) in silicon carbide (SiC), to establish a potential telecom spin-photon interface within a mature semiconductor host. This demonstration of efficient optical spin polarization and readout facilitates all optical measurements of temperature-dependent spin relaxation times (T1). With this technique, we lower the temperature from about 2K to 100 mK to observe a remarkable four-orders-of-magnitude increase in spin T1 from all measured sites, with site-specific values ranging from 57 ms to above 27 s. Furthermore, we identify the underlying relaxation mechanisms, which involve a two-phonon Orbach process, indicating the opportunity for strain-tuning to enable qubit operation at higher temperatures. These results position V4+ in SiC as a prime candidate for scalable quantum nodes in future quantum networks.
Comment: 11 pages, 6 figures
نوع الوثيقة: Working Paper
URL الوصول: http://arxiv.org/abs/2405.16303
رقم الأكسشن: edsarx.2405.16303
قاعدة البيانات: arXiv