دورية أكاديمية
أعرض في EDS

Combining combing and secondary ion mass spectrometry to study DNA on chips using 13C and 15N labeling [version 1; referees: 2 approved]

التفاصيل البيبلوغرافية
العنوان: Combining combing and secondary ion mass spectrometry to study DNA on chips using 13C and 15N labeling [version 1; referees: 2 approved]
المؤلفون: Armelle Cabin-Flaman, Anne-Francoise Monnier, Yannick Coffinier, Jean-Nicolas Audinot, David Gibouin, Tom Wirtz, Rabah Boukherroub, Henri-Noël Migeon, Aaron Bensimon, Laurent Jannière, Camille Ripoll, Victor Norris
المصدر: F1000Research, Vol 5 (2016)
بيانات النشر: F1000 Research Ltd, 2016.
سنة النشر: 2016
المجموعة: LCC:Medicine
LCC:Science
مصطلحات موضوعية: Structure: Transcription & Translation, Medicine, Science
الوصف: Dynamic secondary ion mass spectrometry (D-SIMS) imaging of combed DNA – the combing, imaging by SIMS or CIS method – has been developed previously using a standard NanoSIMS 50 to reveal, on the 50 nm scale, individual DNA fibers labeled with different, non-radioactive isotopes in vivo and to quantify these isotopes. This makes CIS especially suitable for determining the times, places and rates of DNA synthesis as well as the detection of the fine-scale re-arrangements of DNA and of molecules associated with combed DNA fibers. Here, we show how CIS may be extended to 13C-labeling via the detection and quantification of the 13C14N- recombinant ion and the use of the 13C:12C ratio, we discuss how CIS might permit three successive labels, and we suggest ideas that might be explored using CIS.
نوع الوثيقة: article
وصف الملف: electronic resource
اللغة: English
تدمد: 2046-1402
18620086
Relation: http://f1000research.com/articles/5-1437/v1; https://doaj.org/toc/2046-1402
DOI: 10.12688/f1000research.8361.1
URL الوصول: https://doaj.org/article/06afbbafed934cfe9a186200866d7457
رقم الأكسشن: edsdoj.06afbbafed934cfe9a186200866d7457
قاعدة البيانات: Directory of Open Access Journals
الوصف
تدمد:20461402
18620086
DOI:10.12688/f1000research.8361.1